[IEEE 2015 International Semiconductor Conference (CAS) -...

  • Main
  • [IEEE 2015 International Semiconductor...

[IEEE 2015 International Semiconductor Conference (CAS) - Sinaia, Romania (2015.10.12-2015.10.14)] 2015 International Semiconductor Conference (CAS) - A comparative study by TCAD simulation for two different n-in-p silicon particle detector structures

Mekheldi, Mohammed, Oussalah, Slimane, Lounis, Abdenour, Brihi, Nourredine
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/smicnd.2015.7355224
File:
PDF, 441 KB
english, 2015
Conversion to is in progress
Conversion to is failed