![](/img/cover-not-exists.png)
[IEEE 2015 International Semiconductor Conference (CAS) - Sinaia, Romania (2015.10.12-2015.10.14)] 2015 International Semiconductor Conference (CAS) - A comparative study by TCAD simulation for two different n-in-p silicon particle detector structures
Mekheldi, Mohammed, Oussalah, Slimane, Lounis, Abdenour, Brihi, NourredineYear:
2015
Language:
english
DOI:
10.1109/smicnd.2015.7355224
File:
PDF, 441 KB
english, 2015