![](/img/cover-not-exists.png)
[IEEE 2014 Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2014.6.8-2014.6.9)] 2014 Silicon Nanoelectronics Workshop (SNW) - TaOx-based ReRAM stack with NbOx-based selector for 3D cross-point ReRAM application
Fukuda, Natsuki, Nishioka, Yutaka, Suu, KoukouYear:
2014
Language:
english
DOI:
10.1109/snw.2014.7348604
File:
PDF, 270 KB
english, 2014