Dynamic Force Characterization Microscopy Based on...

IEEE/ASME Transactions on Mechatronics 2015 / 12 Vol. 20; Iss. 6

Dynamic Force Characterization Microscopy Based on Integrated Nanorobotic AFM and SEM System for Detachment Process Study

Shen, Yajing, Nakajima, Masahiro, Zhang, Zhenhai, Fukuda, Toshio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
IEEE/ASME Transactions on Mechatronics
DOI:
10.1109/tmech.2015.2413779
Date:
December, 2015
File:
PDF, 832 KB
english, 2015
Conversion to is in progress
Conversion to is failed