A New Degradation Indicator Based on a Statistical Anomaly...

IEEE Transactions on Reliability 2016 / 3 Vol. 65; Iss. 1

A New Degradation Indicator Based on a Statistical Anomaly Approach

Gomes, Joao Paulo Pordeus, Galvao, Roberto Kawakami Harrop, Yoneyama, Takashi, Leao, Bruno P.
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/tr.2015.2417171
Date:
March, 2016
File:
PDF, 1.19 MB
english, 2016
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