[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - Yield prognosis for fab-to-fab product migration
Ahmadi, Ali, Huang, Ke, Nahar, Amit, Orr, Bob, Pas, Michael, Carulli, John M., Makris, YiorgosYear:
2015
Language:
english
DOI:
10.1109/vts.2015.7116261
File:
PDF, 291 KB
english, 2015