[IEEE Fifth World Congress on Intelligent Control and Automation (IEEE Cat. No.04EX788) - Hangzhou, China (June 15-19, 2004)] Fifth World Congress on Intelligent Control and Automation (IEEE Cat. No.04EX788) - Neural network with adaptive genetic algorithm for eddy current nondestructive testing
Sun Xiaoyun,, Liu Donghui,, Zhang Kai,, Guo Liwei,, Zhen Ran,, Liu Jianye,Volume:
3
Year:
2004
Language:
english
DOI:
10.1109/wcica.2004.1341940
File:
PDF, 223 KB
english, 2004