[IEEE Proceedings of the 5th European Workshop on Low Temperature Electronics - Grenoble, France (2002.6.21-2002.6.21)] Proceedings of the 5th European Workshop on Low Temperature Electronics - Cryogenic operation of sub-30 nm nMOSFETs: impact of device architecture
Bertrand, G., Deleonibus, S., Souil, D., Previtali, B., Caillat, C., Guegan, G., Sanquer, M., Balestra, F.Year:
2002
Language:
english
DOI:
10.1109/wolte.2002.1022448
File:
PDF, 303 KB
english, 2002