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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Multicomponent shearography using optical fiber imaging-bundles
Groves, Roger M., James, Stephen W., Tatam, Ralph P., Osten, Wolfgang, Kujawinska, Malgorzata, Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.499784
File:
PDF, 865 KB
english, 2003