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Effects of thermal annealing on elimination of deep defects in amorphous In–Ga–Zn–O thin-film transistors
Tang, Haochun, Ide, Keisuke, Hiramatsu, Hidenori, Ueda, Shigenori, Ohashi, Naoki, Kumomi, Hideya, Hosono, Hideo, Kamiya, ToshioLanguage:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2016.03.005
Date:
March, 2016
File:
PDF, 2.10 MB
english, 2016