Magnetic properties and reliabilities of FeXN...

IEEE Transactions on Magnetics 2000 / Sept. Vol. 36; Iss. 5

Magnetic properties and reliabilities of FeXN (X=Ti,Al,Hf,CoHf,CrHf) nanocrystalline thin film head materials

Kim, K.H., Choi, H.W., Kim, J., Kim, S.R., Kim, K.Y., Plan, S.H., Kim, H.J.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.908550
Date:
January, 2000
File:
PDF, 94 KB
english, 2000
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