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[IEEE 2014 IEEE Far East Forum on Nondestructive Evaluation/Testing (FENDT) - Chengdu, China (2014.6.20-2014.6.23)] 2014 IEEE Far East Forum on Nondestructive Evaluation/Testing - Study on complicated nonlinear phenomena in ultrasonic infrared thermography using circuit simulation method
Zheng, Kai, Zheng, Jiang, Zhang, Shu-yiYear:
2014
Language:
english
DOI:
10.1109/FENDT.2014.6928226
File:
PDF, 2.27 MB
english, 2014