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[IEEE 2015 IEEE Radiation Effects Data Workshop (REDW) - Boston, MA, USA (2015.7.13-2015.7.17)] 2015 IEEE Radiation Effects Data Workshop (REDW) - SEE Tests of the NAND Flash Radiation Tolerant Intelligent Memory Stack
Bagatin, M., Gerardin, S., Paccagnella, A., Sellier, C., Wang, P. X., Ferlet-Cavrios, V., Poivey, C.Year:
2015
Language:
english
DOI:
10.1109/REDW.2015.7336732
File:
PDF, 376 KB
english, 2015