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[IEEE 2014 Winter Simulation Conference - (WSC 2014) - Savanah, GA, USA (2014.12.7-2014.12.10)] Proceedings of the Winter Simulation Conference 2014 - Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing
Kurz, Daniel, Lewitschnig, Horst, Pilz, JurgenYear:
2014
Language:
english
DOI:
10.1109/WSC.2014.7020104
File:
PDF, 433 KB
english, 2014