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[IEEE 42nd IEEE International Conference on Decision and Control - Maui, HI, USA (9-12 Dec. 2003)] 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) - Diagnosis of repeated failures for discrete event systems with linear-time temporal logic specifications
Shengbing Jiang,, Kumar, R.Year:
2003
Language:
english
DOI:
10.1109/cdc.2003.1271639
File:
PDF, 575 KB
english, 2003