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[IEEE 2015 IEEE 35th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2015.4.21-2015.4.24)] 2015 IEEE 35th International Conference on Electronics and Nanotechnology (ELNANO) - Dependence of destruction from the characteristics of radiofrequency impact and length of the electrode
Sychyk, M.M., Maksymenko, V.B., Perepeka, E.O., Kravchuk, B.B., Batsak, B.V.Year:
2015
Language:
english
DOI:
10.1109/elnano.2015.7146899
File:
PDF, 246 KB
english, 2015