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[IEEE 2014 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Gothenburg (2014.9.1-2014.9.4)] 2014 International Symposium on Electromagnetic Compatibility - Computationally-effective ultra-wideband worst-case model of electromagnetic wave diffraction by aperture in conducting screen

Tsionenko, D. A., Maly, S. V., Sinkevich, E. V.
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Year:
2014
Language:
english
DOI:
10.1109/emceurope.2014.6931102
File:
PDF, 266 KB
english, 2014
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