![](/img/cover-not-exists.png)
[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - On mismatch properties of MOS and resistors calibrated ladder structures
Linares-Barranco, B., Serrano-Gotarredona, T., Serrano-Gotarredona, R., Vicente-Sanchez, G.Year:
2004
Language:
english
DOI:
10.1109/iscas.2004.1328210
File:
PDF, 299 KB
english, 2004