[IEEE 2004 IEEE International Symposium on Circuits and...

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[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - On mismatch properties of MOS and resistors calibrated ladder structures

Linares-Barranco, B., Serrano-Gotarredona, T., Serrano-Gotarredona, R., Vicente-Sanchez, G.
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Year:
2004
Language:
english
DOI:
10.1109/iscas.2004.1328210
File:
PDF, 299 KB
english, 2004
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