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[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability
Gomez, Andres, Champac, VictorYear:
2015
Language:
english
DOI:
10.1109/latw.2015.7102496
File:
PDF, 596 KB
english, 2015