Test Generation Methods for Utilization Improvement of...

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IEEE Design and Test 2016

Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms

Kadry, Wisam, Krestyashyn, Dimtry, Morgenshtein, Arkadiy, Nahir, Amir, Sokhin, Vitali, Park, Jin Sung, Park, Sung-Boem, Jeong, Wookyeong, Son, Jae Cheol
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Year:
2016
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdat.2016.2527998
File:
PDF, 526 KB
english, 2016
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