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[IEEE 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Chicago, IL, USA (2015.10.25-2015.10.30)] 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Visual Analytics for fraud detection and monitoring
Leite, Roger A., Gschwandtner, Theresia, Miksch, Silvia, Gstrein, Erich, Kuntner, JohannesYear:
2015
Language:
english
DOI:
10.1109/vast.2015.7347678
File:
PDF, 257 KB
english, 2015