SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - Automatic area based registration method and its application to the surface inspection of steel industry products

García Llenderrozos, Ricardo, Remondino, Fabio, Shortis, Mark R., Álvarez García, Ignacio, Enguita González, José M., Beyerer, Jürgen, Puente León, Fernando, Rodríguez Jiménez, Silvia
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Volume:
8791
Year:
2013
Language:
english
DOI:
10.1117/12.2020543
File:
PDF, 1.66 MB
english, 2013
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