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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Advances in X-ray Free-Electron Lasers II: Instrumentation - An electron beam detector for the FLASH II beam dump
Good, J., Tschentscher, Thomas, Tiedtke, Kai, Kube, G., Leuschner, N., Perlick, F., Sachwitz, M., Schmitz, M., Wittenburg, K., Wohlenberg, T.Volume:
8778
Year:
2013
Language:
english
DOI:
10.1117/12.2021392
File:
PDF, 751 KB
english, 2013