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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - Data-processing strategies for nano-tomography with elemental specification
Lai, Barry, Liu, Yijin, Cats, Korneel H., Nelson Weker, Johanna, Andrews, Joy C., Weckhuysen, Bert M., Pianetta, PieroVolume:
8851
Year:
2013
Language:
english
DOI:
10.1117/12.2026436
File:
PDF, 478 KB
english, 2013