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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Measuring, Modeling, and Reproducing Material Appearance - A new connection space for low-dimensional spectral color management
Ortiz Segovia, Maria V., Urban, Philipp, Allebach, Jan P., Le Moan, Steven, Urban, PhilippVolume:
9018
Year:
2014
Language:
english
DOI:
10.1117/12.2041450
File:
PDF, 312 KB
english, 2014