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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Measuring, Modeling, and Reproducing Material Appearance 2015 - Anisotropic materials appearance analysis using ellipsoidal mirror
Ortiz Segovia, Maria V., Urban, Philipp, Imai, Francisco H., Filip, Jiri, Vavra, RadomirVolume:
9398
Year:
2015
Language:
english
DOI:
10.1117/12.2078361
File:
PDF, 5.34 MB
english, 2015