SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging -...

  • Main
  • SPIE Proceedings [SPIE IS&T/SPIE...

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Measuring, Modeling, and Reproducing Material Appearance 2015 - Anisotropic materials appearance analysis using ellipsoidal mirror

Ortiz Segovia, Maria V., Urban, Philipp, Imai, Francisco H., Filip, Jiri, Vavra, Radomir
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9398
Year:
2015
Language:
english
DOI:
10.1117/12.2078361
File:
PDF, 5.34 MB
english, 2015
Conversion to is in progress
Conversion to is failed