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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Human Vision and Electronic Imaging XX - Designing a biased specification-based subjective test of image quality
Rogowitz, Bernice E., Pappas, Thrasyvoulos N., de Ridder, Huib, Reibman, Amy R.Volume:
9394
Year:
2015
Language:
english
DOI:
10.1117/12.2086256
File:
PDF, 471 KB
english, 2015