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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Modeling Aspects in Optical Metrology V - Detection of fast flying nanoparticles by light scattering over a large volume
Bodermann, Bernd, Frenner, Karsten, Silver, Richard M., Pettazzi, F., Bäumer, S., van der Donck, J., Deutz, A.Volume:
9526
Year:
2015
Language:
english
DOI:
10.1117/12.2186079
File:
PDF, 966 KB
english, 2015