SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII - Polarization sensitivity testing of off-plane reflection gratings
O'Dell, Stephen L., Pareschi, Giovanni, Marlowe, Hannah, McEntaffer, Randal L., DeRoo, Casey T., Miles, Drew M., Tutt, James H., Laubis, Christian, Soltwisch, VictorVolume:
9603
Year:
2015
Language:
english
DOI:
10.1117/12.2186344
File:
PDF, 1.27 MB
english, 2015