SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optical Manufacturing and Testing XI - Null screens type Hartmann to test simple lenses
Fähnle, Oliver W., Williamson, Ray, Kim, Dae Wook, Castillo-Santiago, Gabriel, Castán-Ricaño, Diana, Gozález-Galindo, Alfredo, Avendaño-Alejo, Maximino, Díaz-Uribe, RufinoVolume:
9575
Year:
2015
Language:
english
DOI:
10.1117/12.2188863
File:
PDF, 1.65 MB
english, 2015