SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] X-Ray Nanoimaging: Instruments and Methods II - Low dose, limited energy spectroscopic x-ray microscopy
Lai, Barry, Nelson Weker, Johanna, Li, Yiyang, Chueh, William C.Volume:
9592
Year:
2015
Language:
english
DOI:
10.1117/12.2190799
File:
PDF, 605 KB
english, 2015