SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - New float equivalent calibration method for 2D image measuring system
Zhu, Jigui, Tam, Hwa-Yaw, Xu, Kexin, Xiao, Hai, Han, Sen, Gou, Jiansong, Wang, Zhong, Lu, Ruijun, Shen, XinlanVolume:
9623
Year:
2015
Language:
english
DOI:
10.1117/12.2192835
File:
PDF, 2.20 MB
english, 2015