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SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 13 February 2016)] High-Power Diode Laser Technology and Applications XIV - Assessing the influence of the vertical epitaxial layer design on the lateral beam quality of high-power broad area diode lasers
Zediker, Mark S., Winterfeldt, M., Rieprich, J., Knigge, S., Maaßdorf, A., Hempel, M., Kernke, R., Tomm, J. W., Erbert, G., Crump, P.Volume:
9733
Year:
2016
Language:
english
DOI:
10.1117/12.2210838
File:
PDF, 1001 KB
english, 2016