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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] O3A: Optics for Arts, Architecture, and Archaeology II - Terahertz imaging systems: a non-invasive technique for the analysis of paintings
Fukunaga, K., Pezzati, Luca, Salimbeni, Renzo, Hosako, I., Duling III, I. N., Picollo, M.Volume:
7391
Year:
2009
Language:
english
DOI:
10.1117/12.827452
File:
PDF, 1.73 MB
english, 2009