SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Industrial inspections by speckle interferometry: general requirements and a case study
Viotti, Matias R., Lehmann, Peter H., Albertazzi G., Jr., ArmandoVolume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.827585
File:
PDF, 1.97 MB
english, 2009