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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Characterization of deformable elastic lenses using PDI and null screen
Santiago Alvarado, A., Lehmann, Peter H., Granados Agustín, F. S., Vázquez Montiel, S., Campos García, M., Dìaz Uribe, R.Volume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.827775
File:
PDF, 1.03 MB
english, 2009