SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Dual-CGH interferometry test for x-ray mirror mandrels
Gao, Guangjun, Lehmann, Peter H., Lehan, John P., Griesmann, UlfVolume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.830659
File:
PDF, 108 KB
english, 2009