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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments - Feature points detection and tracking based on SIFT combining with KLT method
Wang, Hongbing, Wang, Yongtian, Sheng, Yunlong, Peng, Zhenming, Liu, Jie, Tatsuno, Kimio, Zheng, Youwang, Liao, Baobing, Wang, YueVolume:
7506
Year:
2009
Language:
english
DOI:
10.1117/12.838618
File:
PDF, 5.27 MB
english, 2009