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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments - Near-infrared spectroscopy and pattern recognition techniques applied to the identification of Jinhua ham
Li, Honglian, Wang, Yongtian, Sheng, Yunlong, Zhao, Zhilei, Pang, Yanping, Tatsuno, Kimio, Wu, Guancheng, Wang, Yanfeng, Li, XiaotingVolume:
7506
Year:
2009
Language:
english
DOI:
10.1117/12.843357
File:
PDF, 284 KB
english, 2009