SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Applications of Digital Image Processing XXXIII - Comparison between two different methods to obtain the wavefront aberration function
Cruz Félix, Angel S., Tescher, Andrew G., Ibarra, Jorge, López, Estela, Rosales, Marco A., Tepichín, EduardoVolume:
7798
Year:
2010
Language:
english
DOI:
10.1117/12.860929
File:
PDF, 728 KB
english, 2010