SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Design and Testing IV - Single-shot white-light dispersive interferometric profilometer
Wang, Yongtian, Zhu, Pei, Wang, Kaiwei, Bentley, Julie, Du, Chunlei, Zhao, Shuangshuang, Tatsuno, Kimio, Urbach, Hendrik P.Volume:
7849
Year:
2010
Language:
english
DOI:
10.1117/12.869987
File:
PDF, 770 KB
english, 2010