SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Design and Testing IV - Research on the surface reflectance measurement of optical element with transparent substrate
Xia, Guo, Wang, Yongtian, Bentley, Julie, Gong, Xingzhi, Cheng, Liang, Du, Chunlei, Tatsuno, Kimio, Yu, Feihong, Urbach, Hendrik P.Volume:
7849
Year:
2010
Language:
english
DOI:
10.1117/12.871620
File:
PDF, 200 KB
english, 2010