SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 21 January 2012)] Ophthalmic Technologies XXII - Spatially highly resolved aberrometer: first exprimental characterizations and assessments
Emica, B., Manns, Fabrice, Söderberg, Per G., Meimon, S., Conan, J.-M., Ho, Arthur, Fusco, T., Chenegros, G., Paques, M.Volume:
8209
Year:
2012
Language:
english
DOI:
10.1117/12.906749
File:
PDF, 1.94 MB
english, 2012