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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Micro- and Nanotechnology Sensors, Systems, and Applications IV - Standard method for characterizing SERS substrates
Guicheteau, Jason A., George, Thomas, Islam, M. Saif, Hankus, Mikella E., Christesen, Steven D., Dutta, Achyut, Fountain, Augustus W., Pellegrino, Paul M., Emmons, Erik D., Tripathi, Ashish, Wilcox, PVolume:
8373
Year:
2012
Language:
english
DOI:
10.1117/12.919102
File:
PDF, 1.11 MB
english, 2012