Module defect prediction under the Eclipse platform: the quadratic effect of software size and the influence of prerelease defects
Roh, James Jungbae, Stoeckel, Jim, Lee, JoohVolume:
7
Year:
2015
Language:
english
Journal:
International Journal of Data Analysis Techniques and Strategies
DOI:
10.1504/IJDATS.2015.067703
File:
PDF, 246 KB
english, 2015