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Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories
Lu, Shyue-Kung, Tsai, Cheng-Ju, Hashizume, MasakiYear:
2016
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2016.2523499
File:
PDF, 2.27 MB
english, 2016