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[IEEE 2015 American Control Conference (ACC) - Chicago, IL, USA (2015.7.1-2015.7.3)] 2015 American Control Conference (ACC) - A study on the effectiveness of proportional-integral-derivative control in multi-actuated atomic force microscopy
Bozchalooi, I. Soltani, Houck, A. C., Youcef-Toumi, K.Year:
2015
Language:
english
DOI:
10.1109/acc.2015.7171869
File:
PDF, 1.78 MB
english, 2015