[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - To a problem on direct tunneling charge carriers through the ultrathin gate dielectric in MOSFETs
Krasnikov, G.Ya., Zaitsev, N.A., Matyushkin, I.V.Year:
2003
Language:
english
DOI:
10.1109/edssc.2003.1283565
File:
PDF, 180 KB
english, 2003