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[IEEE 2015 IEEE International Conference on Image Processing (ICIP) - Quebec City, QC, Canada (2015.9.27-2015.9.30)] 2015 IEEE International Conference on Image Processing (ICIP) - Limitations of the SSIM quality metric in the context of diagnostic imaging
Pambrun, Jean-Francois, Noumeir, RitaYear:
2015
Language:
english
DOI:
10.1109/icip.2015.7351345
File:
PDF, 3.51 MB
english, 2015