[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Design of experiments on an EMC test chip for the interrogation of SI and EMC measures
Coenen, M., Derikx, R.Year:
2003
Language:
english
DOI:
10.1109/icsmc2.2003.1429039
File:
PDF, 691 KB
english, 2003