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[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Critical study of the problems in discrete complex image method
Yavuz, M.E., Aksun, M.I., Dural, G.Year:
2003
Language:
english
DOI:
10.1109/icsmc2.2003.1429154
File:
PDF, 721 KB
english, 2003